Helmut Fischer Goldscope SD 520 is a professional analysis device that measures the thickness of gold, silver, and precious metal coatings quickly and with high precision using XRF (X-Ray Fluorescence) technology. It is an ideal solution for jewelry manufacturing, refineries, assay offices, and quality control laboratories.
Goldscope SD 520 is a German-engineered professional XRF analysis device designed to deliver high accuracy and repeatable measurement results. Using advanced X-Ray Fluorescence (XRF) technology, it enables non-destructive, fast, and reliable thickness measurement of gold, silver, platinum, rhodium, and other precious metal coatings.
As part of the GOLDSCOPE SD series developed by Helmut Fischer, this device is optimized for the analysis of jewelry, precious metals, coins, and decorative metal surfaces. It is especially suitable for determining gold coatings on pure silver as well as rhodium coatings on gold alloys.
The micro-focus measuring system ensures precise results even on small parts and delicate surfaces. The touchscreen user interface minimizes operator error, while the high-speed measurement capability makes the Goldscope SD 520 suitable for intensive production and inspection workflows.
Recommended application areas include refineries, assay offices, mints, jewelry workshops, plating facilities, and quality control laboratories. In Turkey, sales and technical service support are provided by PiramTek.
High-precision XRF measurement technology
Thickness analysis of gold, silver, platinum, rhodium, and precious metal coatings
Micro-focus measurement system ideal for small parts
User-friendly touchscreen interface
Fischer brand reliability with PiramTek technical service support
High-speed measurement suitable for intensive production lines
Calibrated measurement results for maximum accuracy
Authenticity testing of gold jewelry, watches, and coins
| Feature | Value |
|---|---|
| Measurement Technology | XRF – X-Ray Fluorescence |
| Model | Goldscope SD 520 |
| Application Area | Gold / silver / precious metal coating thickness measurement |
| Sample Type | Small parts, jewelry, metal surfaces |
| Focusing System | Micro-focus |
| Display | Touchscreen LCD |
| Measurement Speed | High-speed analysis |
| Accuracy | ± 1 |
| Sample Positioning | Manual |
| Magnification | 1x, 2x, 3x, 4x |
| Maximum Sample Weight | 13 kg |
| Maximum Sample Height | 90 mm |
| X-Ray Tube | Beryllium-window micro-focus tungsten tube |
| High Voltage | Three-stage – 30 / 40 / 50 kV |
| Data Transfer | USB / Ethernet |
| Software | Compatible with Fischer WinFTM |
| Power Supply | 220V |
| Country of Manufacture | Germany |
| Protection Class | IP 40 |
| Minimum Measurement Spot | Approx. Ø 0.7 mm |
| Sales & Service | PiramTek – Authorized Exclusive Distributor |
EN − TL
